Scanning Threshold Particle Counter (STPC)
ID: NIST-SS25-CHIPS-0016Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Semiconductor and Related Device Manufacturing (334413)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/cecfe7aa7bcc4079a5c6149a306f38f7/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from potential sources capable of providing a Scanning Threshold Particle Counter (STPC) to enhance semiconductor manufacturing yield through improved detection of impurities in cleaning chemicals. The STPC must be a turnkey system that adheres to SEMI C79 and SEMI C93 standards, capable of detecting nonvolatile residue particles and native particles in ultrapure water, with integrated particle generation and detection across three size channels (≥ 3 nm, ≥ 9 nm, and ≥ 15 nm). This equipment is critical for ensuring the purity of materials used in semiconductor fabrication, particularly as the industry moves towards next-generation chips requiring even higher purity levels. Interested parties should submit their responses, including company details and product specifications, to the primary contact, Jenna Bortner, at jenna.bortner@nist.gov, by the specified deadline, noting that this notice is for market research purposes and does not constitute a commitment to award a contract.

    Point(s) of Contact
    Jenna Bortner
    jenna.bortner@nist.gov
    Donald Collie
    donald.collie@nist.gov
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    No associated files provided.
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    Scanning Threshold Particle Counter (STPC)
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