Metrology to Enhance Security and Provenance of Microelectronic-based Components and Product
ID: 7Type: BOTH
Overview

Topic

Metrology to Enhance Security and Provenance of Microelectronic-based Components and Product

Agency

Department of CommerceNational Institute of Standards and Technology

Program

Type: SBIRPhase: BOTHYear: 2024
Timeline
  1. 1
    Release Apr 16, 2024 12:00 AM
  2. 2
    Open Apr 16, 2024 12:00 AM
  3. 3
    Next Submission Due Jun 14, 2024 12:00 AM
  4. 4
    Close Jun 14, 2024 12:00 AM
Description

The Department of Commerce, specifically the National Institute of Standards and Technology, is seeking proposals for the FY2024 Small Business Innovation Research (SBIR) Program for CHIPS for America – CHIPS Metrology. The topic of the solicitation is "Metrology to Enhance Security and Provenance of Microelectronic-based Components and Product".

This solicitation aims to support research and development projects that focus on enhancing the security and provenance of microelectronic-based components and products. The technology or research should aim to improve the measurement and characterization of microelectronic devices, with a focus on ensuring their authenticity, integrity, and reliability.

The potential impacts of this technology include strengthening the security of microelectronic-based components and products, reducing the risk of counterfeit or tampered devices, and enhancing the trustworthiness of the supply chain.

The solicitation is open to both Phase I and Phase II proposals. The project duration is not specified, but the application due date is June 14, 2024.

For more information and to submit a proposal, interested parties can visit the SBIR topic link at https://www.sbir.gov/node/2609715 or the solicitation agency URL at https://grants.gov/search-results-detail/353574.

Files
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