Wafer-scale ferromagnetic resonance spectrometer for Advanced MRAM Wafer Data and Quality Control
ID: 10Type: BOTH
Overview

Topic

Wafer-scale ferromagnetic resonance spectrometer for Advanced MRAM Wafer Data and Quality Control

Agency

Department of CommerceNational Institute of Standards and Technology

Program

Type: SBIRPhase: BOTHYear: 2024

Topic Link

https://www.sbir.gov/node/2609735

Additional Information

https://grants.gov/search-results-detail/353574
Timeline
  1. 1
    Release Apr 16, 2024 12:00 AM
  2. 2
    Open Apr 16, 2024 12:00 AM
  3. 3
    Next Submission Due Jun 14, 2024 12:00 AM
  4. 4
    Close Jun 14, 2024 12:00 AM
Description

The Department of Commerce, specifically the National Institute of Standards and Technology, is seeking proposals for the FY2024 Small Business Innovation Research (SBIR) Program for CHIPS for America – CHIPS Metrology. The specific topic of the solicitation is "Wafer-scale ferromagnetic resonance spectrometer for Advanced MRAM Wafer Data and Quality Control".

This solicitation is focused on the development of a wafer-scale ferromagnetic resonance spectrometer for advanced MRAM (Magnetoresistive Random-Access Memory) wafer data and quality control. The technology aims to improve the measurement and analysis of MRAM wafers, which are used in various applications such as data storage, computing, and telecommunications.

The project duration for this SBIR program is not specified in the document. However, the open date for proposals is April 16, 2024, and the close date is June 14, 2024. The funding specifics are not provided in the document.

For more information and to access the solicitation, you can visit the SBIR topic link at https://www.sbir.gov/node/2609735 or the grants.gov page at https://grants.gov/search-results-detail/353574.

Files
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