The Department of Defense (DOD) is seeking proposals for an Ultra-High Voltage Reliability Test System. The objective is to develop a package-level reliability test system capable of conducting various tests for wide bandgap semiconductor devices with a blocking voltage up to 40kV. The proposed system should integrate power supplies, measurement hardware, and control software into one cohesive system and be capable of testing 80 devices simultaneously. The system should provide temperature control from 25C to 200C and relative humidity control from 15% to 85%. The project will be conducted in three phases: feasibility study, prototype development and testing, and delivery of a fully developed pre-production test system. The Phase I feasibility study should address voltage, temperature, humidity, package adaptability, control software, modular design, and safety requirements. Phase II will involve developing a fully functional prototype and conducting rigorous testing. Phase III will focus on delivering a verified pre-production test system and seeking regulatory certification for commercialization. The project is restricted under ITAR regulations.