Metrology for Materials Purity, Properties, and Provenance
ID: 1Type: BOTH
Overview

Topic

Metrology for Materials Purity, Properties, and Provenance

Agency

Department of CommerceNational Institute of Standards and Technology

Program

Type: SBIRPhase: BOTHYear: 2024

Topic Link

https://www.sbir.gov/node/2609703

Additional Information

https://grants.gov/search-results-detail/353574
Timeline
  1. 1
    Release Apr 16, 2024 12:00 AM
  2. 2
    Open Apr 16, 2024 12:00 AM
  3. 3
    Next Submission Due Jun 14, 2024 12:00 AM
  4. 4
    Close Jun 14, 2024 12:00 AM
Description

The Department of Commerce, specifically the National Institute of Standards and Technology, is seeking proposals for the FY2024 Small Business Innovation Research (SBIR) Program for CHIPS for America – CHIPS Metrology. The topic of the solicitation is "Metrology for Materials Purity, Properties, and Provenance". This solicitation is open to both Phase I and Phase II proposals.

The focus of this solicitation is on research related to metrology for materials purity, properties, and provenance. The technology or research being solicited aims to develop innovative methods and tools for measuring and characterizing the purity, properties, and provenance of materials used in the CHIPS for America initiative.

The potential impacts of this technology or research include improving the quality control and reliability of materials used in the CHIPS for America initiative, enhancing the performance and efficiency of electronic devices, and enabling the development of advanced semiconductor technologies.

The project duration for this solicitation is not specified, but the application due date is June 14, 2024. Funding specifics can be found on the grants.gov website.

For more information and to access the solicitation, please visit the following links:

Files
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