FY2024 Small Business Innovation Research (SBIR) Program for CHIPS for America – CHIPS Metrology

Active
No
Status
Open
Release Date
April 16th, 2024
Open Date
April 16th, 2024
Due Date(s)
June 14th, 2024
Close Date
June 14th, 2024
Topic No.
8

Topic

Advanced Electron Backscatter Diffraction (EBSD) detector offering high pixel density, high-speed and low noise operation, and low kV detection enabled by directly detecting electrons using an application specific integrated circuit (ASIC) detector

Agency

Department of CommerceNational Institute of Standards and Technology

Program

Type: SBIRPhase: BOTHYear: 2024

Summary

The Department of Commerce, specifically the National Institute of Standards and Technology, is seeking proposals for the FY2024 Small Business Innovation Research (SBIR) Program for CHIPS for America – CHIPS Metrology. The solicitation is focused on the topic of an Advanced Electron Backscatter Diffraction (EBSD) detector. This detector should offer high pixel density, high-speed, low noise operation, and low kV detection. It should be enabled by directly detecting electrons using an application-specific integrated circuit (ASIC) detector. The technology has potential applications in various fields, including materials science, semiconductor manufacturing, and nanotechnology. The high pixel density and high-speed capabilities of the detector can significantly enhance the accuracy and efficiency of electron backscatter diffraction analysis. The low noise operation and low kV detection enable improved imaging and characterization of materials at lower voltages. The project duration for this solicitation is not specified, but the application due date is June 14, 2024. The funding specifics can be found on the grants.gov website. Interested parties can find more information and submit their proposals through the provided links.

Description

Closed Topic Title