The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a Micro X-ray Computed Tomography (µXCT) system to support advanced semiconductor research under the CHIPS for America Act. The µXCT system is required for non-destructive, three-dimensional imaging of materials and devices, with specifications including a maximum spatial resolution of 500 nm and a minimum voxel size of 50 nm. Interested vendors must respond by January 27, 2026, providing detailed information about their capabilities, including technical specifications and compliance with the outlined requirements. For inquiries, potential respondents can contact Forest Crumpler or Cielo Ibarra via email.