Secondary Ion Mass Spectrometer (SIMS) Analysis System
ID: N0017325RFIMB10Type: Sources Sought
Overview

Buyer

DEPT OF DEFENSEDEPT OF THE NAVYNAVAL RESEARCH LABORATORYWASHINGTON, DC, 20375-5328, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/512cb49cee1742e1a5f1eef041a37c69/view
Timeline
    Description

    The Department of Defense, through the Naval Research Laboratory (NRL), is seeking information from qualified vendors regarding the acquisition of a Secondary Ion Mass Spectrometer (SIMS) analysis system. This system is intended for advanced analysis of semiconductor materials and epitaxial layers, requiring capabilities such as dynamic and static SIMS measurement modes, analysis of sputtered neutrals, and the use of multiple primary ion beams including Cesium, Oxygen, and Argon. The procurement is crucial for enhancing analytical precision in semiconductor research and development, aligning with federal interests in innovation and technology advancement for materials science. Interested vendors must submit their capability statements by February 20, 2025, and can direct inquiries to Michael Broomfield at michael.h.broomfield.civ@us.navy.mil or by phone at 202-875-9785.

    Point(s) of Contact
    Michael Broomfield
    (202) 875-9785
    michael.h.broomfield.civ@us.navy.mil
    Files
    Title
    Posted
    N0017325RFIMB10.pdf
    The Naval Research Laboratory (NRL) has issued a Sources Sought Notice (RFI) for a Secondary Ion Mass Spectrometer (SIMS) analysis system, with a response deadline of February 20, 2025. This notice, designated N0017325RFIMB10, is for market research and does not imply a contractual commitment from the government. It seeks to assess industry interest and identify potential suppliers capable of meeting the specified requirements, which may still undergo revisions as the procurement planning evolves. Interested vendors are invited to provide capability statements detailing their qualifications and relevant experiences, including contact information, technical resources, commercial viability of proposed items, product descriptions, and past performance on similar contracts. The total submission should not exceed ten pages. The RFI underscores that no financial responsibility lies with the government for costs incurred by respondents and clarifies that this is not a formal solicitation. The contact person for the RFI is Michael Broomfield, who can be reached via email for further inquiries. This document emphasizes the NRL’s intention to gather information to guide future procurement but does not guarantee any forthcoming award or contract.
    PR_68_8021_25_SIMS_Specifications.pdf
    The document outlines a Request for Proposal (RFP) for the acquisition of a Secondary Ion Mass Spectrometry (SIMS) analysis system intended for advanced analysis of semiconductor materials and epitaxial layers. The system is required to possess various capabilities, including dynamic and static SIMS measurement modes, the ability to analyze sputtered neutrals, and utilize multiple primary ion beams (Cesium, Oxygen, and Argon). It should accommodate various sample sizes, support simultaneous sample loading, and feature a UHV chamber with bake-out functionality. Additionally, the system must include essential control and analysis software, a library for mass interference spectra, and provisions for on-site installation and training. A minimum warranty of twelve months on parts and labor is also stipulated. This procurement reflects a commitment to enhancing analytical precision in semiconductor research and development, aligning with federal interests in innovation and technology advancement for materials science.
    Lifecycle
    Title
    Type
    Secondary Ion Mass Spectrometer (SIMS) Analysis System
    Currently viewing
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