The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting a sources sought notice for an optical microscope to support its CHIPS Metrology R&D program focused on nondestructive defect detection metrology for semiconductor advanced packaging. The procurement aims to identify potential sources capable of providing an upright optical microscope with specific functionalities, including autofocusing capabilities, motorized turrets, and compatibility with various imaging techniques, to facilitate the characterization of semiconductor defects. This equipment is critical for enhancing the accuracy of X-ray computed tomography defect detection methods. Interested vendors should submit their responses by February 11, 2025, to the primary contact, Elizabeth Timberlake, at elizabeth.timberlake@nist.gov, and ensure their registration in SAM.gov is active.