Silicon Wafers with Multiple Thin Films - Sources Sought Notice
ID: NIST-SS25-CHIPS-0049Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/opp/96b4b0120ac84cf18d0cfaf632852968/view
Timeline
    Description

    The National Institute of Standards and Technology (NIST) is conducting market research through a Sources Sought Notice to identify potential sources for specialized silicon wafers enhanced with multiple thin films. These substrates are crucial for testing biofunctionalization techniques necessary for advanced electronic sensing applications, particularly in assessing the stability and reliability of biomolecule attachment to semiconductor surfaces. The required wafers must be manufactured on high-quality semiconductor fabrication lines and include specific thin film configurations, such as Hafnium Oxide and Silicon Dioxide layers, as well as patterned structures using lithography. Interested vendors should submit their responses, including company details and product specifications, to the primary contact, Nina Lin, at nina.lin@nist.gov, preferably before the closing date. This notice is for market research purposes only and does not guarantee a contract award.

    Point(s) of Contact
    Nina Lin
    nina.lin@nist.gov
    Tracy Retterer
    Tracy.retterer@nist.gov
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    Silicon Wafers with Multiple Thin Films - Sources Sought Notice
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