Double Channel Keithley Source Measuring Unit (SMU)

The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information regarding the procurement of a Double Channel Keithley Source Measuring Unit (SMU) to enhance its research and development efforts in wide-bandgap semiconductors and 2D materials. The required SMU must feature at least two channels, with capabilities for high-current (5A-10A) and very low-current/voltage (1fA, 100nV) measurements, as well as pulsing capabilities of less than 1ms, and compatibility with existing Keithley lab equipment. This equipment is vital for the electrical characterization of materials, which is essential for correlating material defects with device performance, thereby supporting U.S. National Security interests. Interested parties should contact Junee Johnson at junee.johnson@nist.gov to provide company details, product specifications, and other relevant information, as this is a market research notice and not a solicitation for proposals.