Sources Sought Notice for Mid-IR Optical Frequency Comb
ID: NIST-SS26-CHIPS-13Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Sources Sought Notice for Mid-IR Optical Frequency Comb Systems to support its CHIPS Metrology Program's Grand Challenge 1. NIST requires three systems for applications in broadband spectroscopy, spectral reference databases, and new laser diagnostics in semiconductor processes, along with an additional system to fill a critical gap in long-wave infrared spectroradiometry and molecular spectroscopy for the space, defense, and satellite industries. Interested vendors are invited to provide information regarding their capabilities, including product specifications, customization options, and available services, while ensuring that proprietary information is not disclosed. Responses should be submitted via email to Forest Crumpler at forest.crumpler@nist.gov, as NIST seeks to gather market insights to inform future procurement decisions.

    Point(s) of Contact
    Files
    Title
    Posted
    NIST has issued a Sources Sought Notice (NIST-SS26-CHIPS-13) to conduct market research for Mid-IR Optical Frequency Comb Systems. The National Institute of Standards and Technology (NIST) requires three such systems to support the CHIPS Metrology Program's Grand Challenge 1, focusing on materials purity, properties, and provenance in chip manufacturing. These systems will be used for broadband spectroscopy, spectral reference databases, and new laser diagnostics in semiconductor processes. Additionally, one system is needed to address a critical gap in long-wave infrared spectroradiometry and molecular spectroscopy (5 μm to 100 μm) to support the space, defense, and satellite industries. The notice seeks information from potential sources capable of providing these systems, including company details, product specifications, customization capabilities, manufacturing location, NAICS code information, available services (installation, training, maintenance), standard terms and conditions, facility renovation services, pricing, existing federal contracts, and customer references. Responses should avoid proprietary information and be submitted via email to the listed contacts.
    Lifecycle
    Title
    Type
    Similar Opportunities
    Sole Source Justification - Far-Infrared Dual Frequency Comb System
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to procure a Far-Infrared Dual Frequency Comb System through a sole source justification. This procurement aims to acquire specialized laboratory equipment and supplies that are critical for advancing research and development in precision measurement and metrology. The system is essential for various scientific applications, including spectroscopy and telecommunications, where high precision is required. Interested parties can reach out to Daniel Kent at daniel.kent@nist.gov or call 303-497-6533 for further information regarding this opportunity.
    Sources Sought Notice for Continuous Wave Parametric Oscillator (CW OPO) Laser System
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information regarding a Continuous Wave Parametric Oscillator (CW OPO) Laser System to fulfill specific technical requirements. The desired system must include a pump laser, signal and idler laser outputs with defined tunable ranges and power, control electronics compatible with U.S. power and Windows PCs, as well as a high-accuracy wavelength meter and stabilization controls. This procurement is crucial for advancing analytical laboratory capabilities, and interested vendors are encouraged to submit their company details, equipment specifications, and service offerings by email to Forest Crumpler at forest.crumpler@nist.gov by October 31, 2022. This notice serves as market research and does not constitute a solicitation or commitment to award a contract.
    Sources Sought Notice for a MIR Camera
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Sources Sought Notice (NIST-SS26-CHIPS-23) to identify potential sources for a mid-infrared camera and associated lenses. This equipment is critical for the Digital Twins for Atomic Layer Deposition Processes Project, which aims to develop and validate digital twin models for atomic layer deposition processes, requiring high sensitivity and rapid imaging capabilities across the mid-infrared spectral region. Interested vendors are requested to provide detailed company information, product specifications, customization capabilities, and pricing by December 15, 2025, to assist in market research for this procurement. For further inquiries, respondents may contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Donald Collie at donald.collie@nist.gov.
    Sources Sought Notice for Coupled Device Detector Camera System
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from qualified vendors regarding a Coupled Device Detector Camera System through a sources sought notice (NIST-SS26-CHIPS-25). This procurement aims to support the CHIPS RF Waveform and Rapid Frequency Comb Diagnostics for Plasma Etching Project, which focuses on enhancing plasma etching efficiencies via in situ optical diagnostics. The required system includes an intensified electron multiplication charge coupled device (IEMCCD) camera with specific technical specifications, including ultra-low noise, high gain, and fast optical emission spectroscopy capabilities. Interested parties should provide detailed company information, product specifications, and performance capabilities, and may contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Donald Collie at donald.collie@nist.gov for further inquiries.
    Combined Sources Sought Notice and Notice of Intent to Sole Source for Sparce Scanning Device
    Buyer not available
    The Department of Commerce's National Institute of Standards and Technology (NIST) is conducting a sources sought notice to identify potential sources for a compressed sensing scan generator, which is critical for advancing imaging and measurement solutions in integrated circuit (IC) overlay metrology. The procurement aims to enhance the speed and accuracy of image acquisition for semiconductor manufacturing processes, utilizing artificial intelligence and advanced image processing techniques. This initiative is part of the CHIPS R&D Program, which focuses on improving measurement capabilities essential for IC production. Interested vendors are encouraged to respond with their capabilities and relevant product information to the primary contact, Nina Lin, at nina.lin@nist.gov, by the specified deadline, as the government intends to issue a sole source award to Panoscientific, LLC if no other capable sources are identified.
    System upgrades for Magneto-Raman and photoluminescence spectroscopy
    Buyer not available
    The National Institute of Standards and Technology (NIST) is seeking sources for system upgrades to its magneto-Raman and photoluminescence spectroscopy instrument, which is essential for evaluating 2D and wide band gap materials in the semiconductor industry. The procurement includes a new magnet power supply, a service contract, and compatible components such as low-temperature compatible, long working distance apochromatic objectives, titanium sample holders, and titanium screws for mounting electrical devices. These upgrades are critical for analyzing optical spectroscopy responses under magnetic fields at cryogenic temperatures. Interested vendors should contact Junee Johnson at junee.johnson@nist.gov for further details, as this notice serves market research purposes and does not guarantee a contract award.
    Sources Sought Notice for CHIPS High-Throughput High-Resolution X-ray Laminography/Tomography System for Advanced Packaged Semiconductor Devices and Substrates
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is conducting market research through a Sources Sought Notice to identify potential sources for a high-throughput high-resolution X-ray laminography/tomography system aimed at advancing semiconductor device manufacturing. The system is required to provide non-destructive three-dimensional imaging with specific performance criteria, including a resolution of 1 µm and a scan speed of at least 0.5 mm³/min, to support critical metrology gaps in the semiconductor ecosystem. This procurement is vital for enhancing metrology capabilities within the CHIPS Metrology program, which collaborates with various stakeholders in the semiconductor industry. Interested vendors should respond with detailed information about their capabilities and products by contacting Tracy Retterer or Donald Collie via email, as there is no solicitation available at this time, and responses are due as soon as possible.
    Environmental test chamber
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from qualified vendors regarding the procurement of an Environmental Test Chamber and a Water Recirculation System as part of a Sources Sought Notice (NIST-SS26-CHIPS-29). The Environmental Test Chamber must meet specific requirements, including a workspace of over 1.5 cubic feet, a temperature range of -35°C to +175°C, and humidity control between 10%-95% RH, among other technical specifications, to support metrology research for semiconductor device manufacturing. This procurement is crucial for evaluating materials used in semiconductor devices, thereby enhancing device reliability and performance. Interested parties should submit their responses, including company information and product specifications, to Junee Johnson at junee.johnson@nist.gov, as this notice is for market research purposes and no solicitation is currently available.
    Twenty-seven (27) semirigid cables, two (2) VNA test cables, ten (10) flexible cables
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for the procurement of twenty-seven (27) semirigid cables, two (2) VNA test cables, and ten (10) flexible cables. These cables are critical for the automated measurement of NIST's standard reference materials related to complex permittivity, supporting the NIST CHIPS program. The sources sought notice outlines specific technical requirements for each cable type, including dimensions, frequency ranges, and connector specifications, and emphasizes that this inquiry is for market research purposes only, with no commitment to issue a solicitation or award a contract. Interested vendors should provide their company information, product details, and pricing to the primary contact, Elizabeth Timberlake, at elizabeth.timberlake@nist.gov, or the secondary contact, Donald Collie, at donald.collie@nist.gov.
    Sources Sought Notice for two (2) CMOS Cameras
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking potential sources for two scientific CMOS cameras through a sources sought notice (NIST-SS26-CHIPS-24). These cameras are integral to the Digital Twins for Atomic Layer Deposition Processes Project, aimed at developing and validating digital twin models for atomic layer deposition processes by enabling high-sensitivity and high-speed absorption tomographic measurements. Key technical specifications include a back-illuminated scientific CMOS sensor, high quantum efficiency, global shutter capability, and a minimum frame readout rate of 100 frames per second. Interested vendors should submit their responses, including company information and product details, by December 15, 2025, to Elizabeth Timberlake at elizabeth.timberlake@nist.gov or Donald Collie at donald.collie@nist.gov, with submissions not exceeding 20 pages.