Combined Sources Sought/Notice of Intent to Sole Source: Pump Suppression Module
ID: NIST-SS26-CHIPS-40Type: Sources Sought
Overview

Buyer

COMMERCE, DEPARTMENT OFNATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGYDEPT OF COMMERCE NISTGAITHERSBURG, MD, 20899, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/workspace/contract/opp/65f3ebf7d9fb4947b58504694042ac9c/view
Timeline
    Description

    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to noncompetitively acquire a Pump Suppression Module essential for a new Brillouin Light Scattering (BLS) spectrometer as part of its CHIPS project. This module is critical for accurately measuring magnetic materials parameters, which directly supports advancements in magnetic random-access memories (MRAM) and enhances the semiconductor industry's product reliability and performance. The procurement is intended to be fulfilled by Light Machinery, Inc., the only vendor identified that meets the stringent specifications required for the module, including a suppression capability of at least 60 dB and high transmission rates. Interested parties must submit their responses by August 1, 2025, to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov.

    Point(s) of Contact
    Cielo Ibarra
    cielo.ibarra@nist.gov
    Files
    No associated files provided.
    Lifecycle
    Title
    Type
    Combined Sources Sought/Notice of Intent to Sole Source: Pump Suppression Module
    Currently viewing
    Sources Sought
    Similar Opportunities
    Optical Microscope
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking responses to a Sources Sought Notice for the procurement of an Optical Microscope. The primary objective is to support the NIST CHIPS Metrology R&D program, which focuses on nondestructive defect detection metrology for semiconductor advanced packaging, requiring a microscope capable of various imaging modes and equipped with advanced features for precision measurements. This procurement is critical for enhancing the accuracy of defect detection in semiconductor failure analysis, with a focus on characterizing defects through precise optical measurements. Interested vendors should submit their capabilities and relevant information to Cielo Ibarra at cielo.ibarra@nist.gov by December 15, 2025, while noting that this notice does not constitute a commitment to award a contract.
    Custom Magneto-resistive Sensors
    Buyer not available
    The National Institute of Standards and Technology (NIST) is seeking responses to a Sources Sought Notice for the fabrication of custom magneto-resistive sensors. These sensors are intended for use in a scanning magnetic microscope being developed for the CHIPS Metrology Project, specifically for acquiring 3D thermal images in semiconductor packages. The procurement requires sensors that meet specific technical specifications, including a frequency range from DC to 100 kHz, field sensitivity parameters, and operational conditions, with a minimum delivery of 100 sensors. Interested parties should respond to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov, with their capabilities and relevant experience by the deadline of December 12, 2025, for any questions regarding the notice.
    Sources Sought Notice for Continuous Wave Parametric Oscillator (CW OPO) Laser System
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information regarding a Continuous Wave Parametric Oscillator (CW OPO) Laser System to fulfill specific technical requirements. The desired system must include a pump laser, signal and idler laser outputs with defined tunable ranges and power, control electronics compatible with U.S. power and Windows PCs, as well as a high-accuracy wavelength meter and stabilization controls. This procurement is crucial for advancing analytical laboratory capabilities, and interested vendors are encouraged to submit their company details, equipment specifications, and service offerings by email to Forest Crumpler at forest.crumpler@nist.gov by October 31, 2022. This notice serves as market research and does not constitute a solicitation or commitment to award a contract.
    Combined Sources Sought/Notice of Intent to Sole Source: Sub-THz VNA Extenders and Amplifier
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking to noncompetitively acquire Sub-THz VNA extenders and a high-power amplifier to support its CHIPS program focused on high-frequency transistor characterization. The procurement includes specific requirements for WR6.5, WR5.1, and WR3.4 VNA waveguide extenders, as well as a D-band waveguide amplifier, all of which are critical for developing a unique microelectronic measurement setup essential for semiconductor testing. This equipment is vital for enhancing measurement capabilities and accelerating the development of next-generation microelectronic devices. Interested vendors must respond by December 23, 2025, with their capabilities and relevant information to the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov.
    Atomic Force Microscope for use in a Scanning Electron Microscope
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking sources for a compact Atomic Force Microscope (AFM) intended for use in conjunction with a Scanning Electron Microscope (SEM). This procurement is part of the CHIPS Act initiative aimed at enhancing metrology research and development to support semiconductor manufacturing, with a focus on improving device reliability through advanced measurement technologies. The AFM will facilitate live imaging and analysis of two-dimensional materials, crucial for understanding device performance and failure mechanisms, thereby streamlining the fabrication and optimization processes for next-generation semiconductor devices. Interested vendors should contact Cielo Ibarra at cielo.ibarra@nist.gov and submit their responses by the specified deadlines, ensuring they include relevant company information and capabilities.
    Notice of Intent to Sole Source to Micronix USA for High Vacuum Positioning Stages
    Buyer not available
    The National Institute of Standards and Technology (NIST) is issuing a Notice of Intent to Sole Source a contract to Micronix USA for the procurement of High Vacuum Compatible Sample Positioning Stages. The primary objective of this procurement is to acquire motorized stages that enable computerized control of nine axes within a vacuum chamber, which are critical for the precise measurement of microelectronic features using extreme-ultraviolet (EUV) light. This equipment is essential for advancing metrology in microelectronics manufacturing as part of the CHIPS R&D Metrology Program. Interested parties are encouraged to respond with their capabilities and relevant information to the primary contact, Elizabeth Timberlake, at elizabeth.timberlake@nist.gov, by December 15, 2025, as this notice serves for market research purposes and does not constitute a commitment to award a contract.
    Ultraviolet Pulsed Laser Head
    Buyer not available
    The National Institute of Standards and Technology (NIST) is conducting market research to identify potential sources for an ultraviolet 266-nm pulsed laser head compatible with its existing time-resolved photoluminescence system. The procurement aims to replace visible laser heads with a 266 nm pulsed laser for characterizing wide bandgap semiconductor materials such as GaN or SiC, requiring specific performance capabilities including picosecond pulses and an average power of at least 1 mW at a repetition frequency of 80 MHz. Interested vendors must submit detailed information about their products, including specifications, customization options, and service offerings, by emailing the primary contact, Cielo Ibarra, at cielo.ibarra@nist.gov. This sources sought notice is for market research purposes only and does not constitute a commitment to issue a solicitation or award a contract.
    Sources Sought Notice for Mid-IR Optical Frequency Comb
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), has issued a Sources Sought Notice for Mid-IR Optical Frequency Comb Systems to support its CHIPS Metrology Program's Grand Challenge 1. NIST requires three systems for applications in broadband spectroscopy, spectral reference databases, and new laser diagnostics in semiconductor processes, along with an additional system to fill a critical gap in long-wave infrared spectroradiometry and molecular spectroscopy for the space, defense, and satellite industries. Interested vendors are invited to provide information regarding their capabilities, including product specifications, customization options, and available services, while ensuring that proprietary information is not disclosed. Responses should be submitted via email to Forest Crumpler at forest.crumpler@nist.gov, as NIST seeks to gather market insights to inform future procurement decisions.
    Amended Sources Sought Notice for a Ultra-High Vacuum Sample Backout Chamber
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from potential providers for an ultra-high vacuum (UHV) sample backout chamber, which is essential for the CHIPS R&D project aimed at testing materials for UHV compatibility in the U.S. semiconductor industry. This Sources Sought Notice is part of market research to inform future procurement strategies and does not constitute a solicitation; NIST is looking for company summaries that include size status under NAICS code 334516 and confirmation of active registration on sam.gov. Responses to this notice, which has been extended to December 12, 2025, should be submitted via email and must not exceed ten pages, with no guarantee of contract award or responses to inquiries regarding market research results. Interested parties can contact Elizabeth Timberlake at elizabeth.timberlake@nist.gov for further information.
    ScanWave Pro-Electronic Probe Interface Module (ePIM)
    Buyer not available
    The Department of Commerce, specifically the National Institute of Standards and Technology (NIST), is seeking information from potential sources for a fully electronically tunable Probe Interface Module (ePIM) to replace an existing manually tunable module used with their Oxford/Asylum Research AFM MFP-3D system. This procurement is essential for advancing NIST's measurement science research, particularly in addressing gaps within the semiconductor supply chain and R&D ecosystem. The required ePIM must feature electronic tunability, compatibility with the existing AFM and its software, and include corresponding software solutions. Interested parties are encouraged to contact Junee Johnson at junee.johnson@nist.gov for further details, as this notice is for market research purposes only and does not guarantee a solicitation or contract award.