473958 Request for Information (RFI) 200kV Workhorse Transmission Electron Microscope
ID: 473958Type: Sources Sought
Overview

Buyer

ENERGY, DEPARTMENT OFENERGY, DEPARTMENT OFBROOKHAVEN NATL LAB -DOE CONTRACTORUpton, NY, 11973, USA

NAICS

Analytical Laboratory Instrument Manufacturing (334516)

PSC

LABORATORY EQUIPMENT AND SUPPLIES (6640)

Original Source

https://sam.gov/workspace/contract/opp/3e6e66fc1fd04421ac7fd46b2ac559d4/view
Timeline
    Description

    The Department of Energy, through Brookhaven National Laboratory, is seeking information from qualified vendors regarding the procurement of a 200kV cold-field-emission-gun (CFEG) high-resolution transmission electron microscope (HRTEM)/scanning transmission electron microscope (STEM). This advanced instrument is essential for atomic-resolution characterization and analysis of nanoscale materials, requiring specific capabilities such as high-resolution imaging, efficient detectors, and various operational modes. Interested parties are invited to submit their capabilities and responses to the attached RFI document by 3:00 PM Eastern Time on January 6, 2026, with submissions directed to Lisa Gonzales at lgonzales@bnl.gov. This RFI is for information and planning purposes only and does not constitute a solicitation for proposals.

    Point(s) of Contact
    Lisa Gonzales
    (631) 344-5965
    lgonzales@bnl.gov
    Files
    Title
    Posted
    1. RFI_-_TEM_2025-12-15.pdf
    The Center for Functional Nanomaterials at Brookhaven National Laboratory is seeking a 200kV cold-field-emission-gun (CFEG) high-resolution transmission electron microscope (HRTEM)/scanning transmission electron microscope (STEM). This instrument is crucial for atomic-resolution characterization, elemental composition, chemical bonding, and electronic properties of nanoscale materials, operating at 200kV and 80kV. Key features include high-efficiency detectors, an energy dispersive X-ray detector (EDS) with at least two 100mm2 silicon drift detectors, and an electron energy-loss spectrometer (EELS) with 0.3eV resolution. The microscope must have a CFEG source with high brightness and stability, guaranteed TEM resolution of 0.23nm or better, and STEM resolution of 0.136nm or better. Required imaging modes are HAADF and BF in STEM, with diffraction modes including convergent-beam, micro-beam, nano-beam, and Ronchigram acquisition. The system needs an automated sample holder loading system, an independent Descan system for EELS, and an Electrostatic Dose Modulator. Optional configurations include a high-energy resolution EELS, nanometer pattern generation system, high-tilt holder for tomography, and Nanomegas 4D-STEM. Vendors must address room requirements, provide onsite training, electrical safety certification, warranty/servicing plans, and details on manufacturing origin and commercial product status.
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