Combined Sources Sought Notice and Notice of Intent to Award a Sole Source Contract for ScanWave Pro electronic controller for a Vero AFM

The Department of Commerce's National Institute of Standards and Technology is conducting market research to identify potential sources capable of providing a ScanWave Pro electronic controller for a Vero Atomic Force Microscope (AFM). The contractor must deliver one scanning Microwave Impedance Microscopy electronic controller that integrates with the government-owned Vero AFM through the existing ScanWave 2.0 Probe Interface module to support nanoscale impedance property measurements. Technical requirements include providing a single integrated electronic controller to replace the current modular assembly, delivering approximately a tenfold increase in measurement sensitivity, and including the manufacturer's standard commercial warranty. Place of performance for the equipment integration is Gaithersburg, Maryland. Responses containing capability statements, product specifications, and standard commercial pricing must be submitted via email to Rudolph Spencer at rudolph.spencer@nist.gov.